Measuring non-cognitive facets of vocational/professional competence - development and application of the Embedded Experience Sampling (EES) methodRausch, Andreas ; Seifried, Jürgen ; Sembill, Detlef ; Schley, Thomas
BASE:
Rausch, Andreas
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Seifried, Jürgen
;
Sembill, Detlef
;
Schley, Thomas
Google Scholar: Rausch, Andreas ; Seifried, Jürgen ; Sembill, Detlef ; Schley, Thomas ORCID: Rausch, Andreas ORCID: 0000-0002-0749-2496 ; Seifried, Jürgen ORCID: 0000-0002-9460-7721 ; Sembill, Detlef ; Schley, Thomas Page ViewsYou have found an error? Please let us know about your desired correction here: E-Mail Actions (login required)
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