Controlling statistical decision errors with minimal costs: Relative efficiency of sequential probability ratio t-tests vs. Bayesian t-testsSchnuerch, Martin ; Erdfelder, Edgar
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Schnuerch, Martin
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Erdfelder, Edgar
Google Scholar: Schnuerch, Martin ; Erdfelder, Edgar ORCID: Schnuerch, Martin ORCID: 0000-0001-6531-2265 ; Erdfelder, Edgar ORCID: 0000-0003-1032-3981 Page ViewsYou have found an error? Please let us know about your desired correction here: E-Mail Actions (login required)
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