Waldian t tests: A sequential Bayes factor design for accepting and rejecting the null hypothesis with controlled error probabilities


Schnuerch, Martin ; Heck, Daniel W. ; Erdfelder, Edgar



Document Type: Conference presentation
Year of publication: 2018
Conference title: 2018 Meeting of the European Mathematical Psychology Group
Location of the conference venue: Genova, Italy
Date of the conference: 30.07.-02.08.2018
Publication language: English
Institution: School of Social Sciences > Kognitive Psychologie u. Differentielle Psychologie (Erdfelder)
Subject: 150 Psychology




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