Waldian t tests: A sequential Bayes factor design for accepting and rejecting the null hypothesis with controlled error probabilities


Schnuerch, Martin ; Heck, Daniel W. ; Erdfelder, Edgar


Document Type: Conference presentation
Year of publication: 2018
Conference title: 2018 Meeting of the European Mathematical Psychology Group
Location of the conference venue: Genova, Italy
Date of the conference: 30.07.-02.08.2018
Publication language: English
Institution: School of Social Sciences > Kognitive Psychologie u. Differentielle Psychologie (Erdfelder)
Subject: 150 Psychology




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Schnuerch, Martin ORCID: 0000-0001-6531-2265 ; Heck, Daniel W. ORCID: 0000-0002-6302-9252 ; Erdfelder, Edgar ORCID: 0000-0003-1032-3981 Waldian t tests: A sequential Bayes factor design for accepting and rejecting the null hypothesis with controlled error probabilities. (2018) 2018 Meeting of the European Mathematical Psychology Group (Genova, Italy) [Conference presentation]


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