Efficient process conformance checking on the basis of uncertain event-to-activity mappings


Aa, Han van der ; Leopold, Henrik ; Reijers, Hajo A.



DOI: https://doi.org/10.1109/TKDE.2019.2897557
URL: https://ieeexplore.ieee.org/document/8634941
Additional URL: https://www.computer.org/csdl/journal/tk/2020/05/0...
Document Type: Article
Year of publication: 2020
The title of a journal, publication series: IEEE Transactions on Knowledge and Data Engineering : TKDE
Volume: 32
Issue number: 5
Page range: 927-940
Place of publication: Piscataway, NJ
Publishing house: IEEE Service Center
ISSN: 1041-4347 , 1558-2191
Publication language: English
Institution: School of Business Informatics and Mathematics > Artificial Intelligence Methods (Juniorprofessur) (van der Aa 2020-2023)
Subject: 004 Computer science, internet
Abstract: Conformance checking enables organizations to automatically identify compliance violations based on the analysis of observed event data. A crucial requirement for conformance-checking techniques is that observed events can be mapped to normative process models used to specify allowed behavior. Without a mapping, it is not possible to determine if an observed event trace conforms to the specification or not. A considerable problem in this regard is that establishing a mapping between events and process model activities is an inherently uncertain task. Since the use of a particular mapping directly influences the conformance of an event trace to a specification, this uncertainty represents a major issue for conformance checking. To overcome this issue, we introduce a probabilistic conformance-checking technique that can deal with uncertain mappings. Our technique avoids the need to select a single mapping by taking the entire spectrum of possible mappings into account. A quantitative evaluation demonstrates that our technique can be applied on a considerable number of real-world processes where existing conformance-checking techniques fail.




Dieser Eintrag ist Teil der Universitätsbibliographie.




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