Parameter detection of thin films from their x-ray reflectivity by support vector machines


Strauß, Daniel J. ; Steidl, Gabriele ; Welzel, Udo


Document Type: Article
Year of publication: 2004
The title of a journal, publication series: Applied Numerical Mathematics
Volume: 48
Issue number: 2
Page range: 223-236
Place of publication: Amsterdam
Publishing house: Elsevier
ISSN: 0168-9274
Publication language: English
Institution: School of Business Informatics and Mathematics > Angewandte Mathematik u. Informatik (Steidl -2011)
Subject: 004 Computer science, internet

Dieser Eintrag ist Teil der Universitätsbibliographie.




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Strauß, Daniel J. ; Steidl, Gabriele ; Welzel, Udo (2004) Parameter detection of thin films from their x-ray reflectivity by support vector machines. Applied Numerical Mathematics Amsterdam 48 2 223-236 [Article]


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