Parameter detection of thin films from their x-ray reflectivity by support vector machines

Document Type:	Article
Year of publication:	2004
The title of a journal, publication series:	Applied Numerical Mathematics
Volume:	48
Issue number:	2
Page range:	223-236
Place of publication:	Amsterdam
Publishing house:	Elsevier
ISSN:	0168-9274
Publication language:	English
Institution:	School of Business Informatics and Mathematics > Angewandte Mathematik u. Informatik (Steidl -2011)
Subject:	004 Computer science, internet

Dieser Eintrag ist Teil der Universitätsbibliographie.

BASE: Strauß, Daniel J. ; Steidl, Gabriele ; Welzel, Udo

Google Scholar: Strauß, Daniel J. ; Steidl, Gabriele ; Welzel, Udo

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