Can patterns improve i* modeling? Two exploratory studiesStrohmaier, Markus ; Horkoff, Jennifer ; Yu, Eric ; Aranda, Jorge ; Easterbrook, Steve
BASE:
Strohmaier, Markus
;
Horkoff, Jennifer
;
Yu, Eric
;
Aranda, Jorge
;
Easterbrook, Steve
Google Scholar: Strohmaier, Markus ; Horkoff, Jennifer ; Yu, Eric ; Aranda, Jorge ; Easterbrook, Steve ORCID: Strohmaier, Markus ![]()
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