Zur Validität von Embedded Experience Sampling (EES) bei der Messung nicht-kognitiver Facetten domänenspezifischer Problemlösekompetenz


Rausch, Andreas ; Kögler, Kristina ; Seifried, Jürgen



Document Type: Conference presentation
Year of publication: 2020
Conference title: GEBF-Tagung 2020, 8. Jahrestagung der Gesellschaft für Empirische Bildungs­forschung (conference canceled)
Location of the conference venue: Potsdam, Germany, Canceled
Date of the conference: 25.-27.03.2020
Related URLs:
Publication language: German
Institution: Business School > Wirtschaftspädagogik, Lernen im Arbeitsprozess (Rausch 2016-)
Subject: 330 Economics
370 Education







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