Optical Grating Studies in A-As2S3 Films using Scanning Force Microscopy

Ackermann, J. ; Dietrich, Christoph H. ; Männer, Reinhard ; Noehte, Steffen ; Schwartz, Kurt

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URL: https://ub-madoc.bib.uni-mannheim.de/815
URN: urn:nbn:de:bsz:180-madoc-8150
Document Type: Working paper
Year of publication: 1995
The title of a journal, publication series: Technical Reports
Volume: 95-016
Place of publication: Mannheim
Publication language: English
Institution: School of Business Informatics and Mathematics > Sonstige - Fakultät für Wirtschaftsinformatik und Wirtschaftsmathematik
MADOC publication series: Veröffentlichungen der Fakultät für Mathematik und Informatik > Institut für Informatik > Technical Reports
Subject: 004 Computer science, internet
Subject headings (SWD): Synthetisches Hologramm , Phasenmessung
Abstract: For high quality computer generated holograms As2S3-films are used as a real-ime phase recording material . To reach the required quality of optical interconnects it is necessary to expose the exact refractive index change for defined wave front distortions. Different methods were used, as scanning force microscopy (SFM), Mach Zehnder interferometry, confocal laser microscopy and interferometer microscopy to measure the wave front distortion on the pixel level. A computer simulation shows good agreement with the experimental results.
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