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2025

Mayer, Christian ORCID: 0000-0002-0443-6624 ; Mauch, Sarah-Lea ; Leible, Stephan ; Seifried, Jürgen ORCID: 0000-0002-9460-7721 Competence-Based assessment for SAP4school: Adaption and pilot testing. Mathis, Uta ; Scheruhn, Hans-Jürgen ; Weidner, Stefan ; Wittges, Holger ; Biener, André 238-245 In: SAP Academic Community Conference 2025 (D-A-CH) : Business process management drives digital transformation , Konferenzband der SAP Academic Community Conference 2025 (D-A-CH) (2025) Potsdam SAP Academic Community Conference DACH 2025 (Potsdam, Germany) [Conference or workshop publication]

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