Number of items: 1.
Metzger, Noah ; Hoffmann, Lars  ORCID: 0000-0002-9667-0310 ; Bartelt, Christian ; Stuckenschmidt, Heiner ORCID: 0000-0002-0209-3859 ; Wommer, Michael ; Bescos del Castillo, Maria Belen
Towards trace-graphs for data-driven test case mining in the domain of automated driving.
41-48
In: Third IEEE International Conference on Artificial Intelligence Testing: AITest 2021 : proceedings : 23-26 August 2021, online event
(2021)
Piscataway, NJ
2021 IEEE International Conference on Artificial Intelligence Testing (AITest)
(Oxford, UK, Online)
[Conference or workshop publication]
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This list was created automatically on Wed Feb 11 06:31:36 2026 CET |
