Charge Trapping in ONO Interpoly Dielectric of FLOTOX EEPROM Cells


Brücklmeier, Eric-Roger ; Kux, Andreas ; Kakoschke, Ronald ; Palm, Herbert


URL: http://dx.doi.org/10.1016/S0167-9317(99)00415-3
Document Type: Article
Year of publication: 1999
The title of a journal, publication series: Microelectronic Engineering
Volume: 48
Issue number: 1/4
Page range: 411-414
Place of publication: Amsterdam [u.a.]
Publishing house: Elsevier
ISSN: 0167-9317
Publication language: English
Institution: School of Business Informatics and Mathematics > Elektrotechnik (Fliege Em)
Subject: 004 Computer science, internet

Dieser Eintrag ist Teil der Universitätsbibliographie.




+ Citation Example and Export

Brücklmeier, Eric-Roger ; Kux, Andreas ; Kakoschke, Ronald ; Palm, Herbert (1999) Charge Trapping in ONO Interpoly Dielectric of FLOTOX EEPROM Cells. Microelectronic Engineering Amsterdam [u.a.] 48 1/4 411-414 [Article]


+ Search Authors in

+ Page Views

Hits per month over past year

Detailed information



You have found an error? Please let us know about your desired correction here: E-Mail


Actions (login required)

Show item Show item