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Efficient process conformance checking on the basis of uncertain event-to-activity mappings
Aa, Han van der
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Leopold, Henrik
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Reijers, Hajo A.
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DOI:
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https://doi.org/10.1109/TKDE.2019.2897557
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URL:
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https://ieeexplore.ieee.org/document/8634941
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Weitere URL:
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https://www.computer.org/csdl/journal/tk/2020/05/0...
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Dokumenttyp:
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Zeitschriftenartikel
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Erscheinungsjahr:
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2020
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Titel einer Zeitschrift oder einer Reihe:
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IEEE Transactions on Knowledge and Data Engineering : TKDE
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Band/Volume:
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32
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Heft/Issue:
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5
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Seitenbereich:
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927-940
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Ort der Veröffentlichung:
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Piscataway, NJ
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Verlag:
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IEEE Service Center
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ISSN:
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1041-4347 , 1558-2191
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Sprache der Veröffentlichung:
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Englisch
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Einrichtung:
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Fakultät für Wirtschaftsinformatik und Wirtschaftsmathematik > Artificial Intelligence Methods (Juniorprofessur) (van der Aa 2020-)
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Fachgebiet:
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004 Informatik
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Abstract:
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Conformance checking enables organizations to automatically identify compliance violations based on the analysis of observed event data. A crucial requirement for conformance-checking techniques is that observed events can be mapped to normative process models used to specify allowed behavior. Without a mapping, it is not possible to determine if an observed event trace conforms to the specification or not. A considerable problem in this regard is that establishing a mapping between events and process model activities is an inherently uncertain task. Since the use of a particular mapping directly influences the conformance of an event trace to a specification, this uncertainty represents a major issue for conformance checking. To overcome this issue, we introduce a probabilistic conformance-checking technique that can deal with uncertain mappings. Our technique avoids the need to select a single mapping by taking the entire spectrum of possible mappings into account. A quantitative evaluation demonstrates that our technique can be applied on a considerable number of real-world processes where existing conformance-checking techniques fail.
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 | Dieser Eintrag ist Teil der Universitätsbibliographie. |
 Suche Autoren in
BASE:
Aa, Han van der
;
Leopold, Henrik
;
Reijers, Hajo A.
Google Scholar:
Aa, Han van der
;
Leopold, Henrik
;
Reijers, Hajo A.
ORCID:
Aa, Han van der  ORCID: https://orcid.org/0000-0002-4200-4937, Leopold, Henrik and Reijers, Hajo A.
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