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Waldian t tests: Sequential Bayesian t tests with controlled error probabilitiesSchnuerch, Martin ; Heck, Daniel W. ; Erdfelder, Edgar
BASE:
Schnuerch, Martin
;
Heck, Daniel W.
;
Erdfelder, Edgar
Google Scholar: Schnuerch, Martin ; Heck, Daniel W. ; Erdfelder, Edgar ORCID: Schnuerch, Martin ORCID: 0000-0001-6531-2265 ; Heck, Daniel W. ORCID: 0000-0002-6302-9252 ; Erdfelder, Edgar ORCID: 0000-0003-1032-3981
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