Towards trace-graphs for data-driven test case mining in the domain of automated driving


Metzger, Noah ; Hoffmann, Lars ; Bartelt, Christian ; Stuckenschmidt, Heiner ; Wommer, Michael ; Bescos del Castillo, Maria Belen



DOI: https://doi.org/10.1109/AITEST52744.2021.00019
URL: https://ieeexplore.ieee.org/document/9564100
Additional URL: https://www.researchgate.net/publication/355346704...
Document Type: Conference or workshop publication
Year of publication: 2021
Book title: Third IEEE International Conference on Artificial Intelligence Testing: AITest 2021 : proceedings : 23-26 August 2021, online event
Page range: 41-48
Conference title: 2021 IEEE International Conference on Artificial Intelligence Testing (AITest)
Location of the conference venue: Oxford, UK, Online
Date of the conference: 23.-26.08.2021
Place of publication: Piscataway, NJ
Publishing house: IEEE
ISBN: 978-1-6654-3482-9 , 978-1-6654-3481-2
Related URLs:
Publication language: English
Institution: School of Business Informatics and Mathematics > Practical Computer Science II: Artificial Intelligence (Stuckenschmidt 2009-)
Subject: 004 Computer science, internet




Dieser Eintrag ist Teil der Universitätsbibliographie.




Metadata export


Citation


+ Search Authors in

+ Page Views

Hits per month over past year

Detailed information



You have found an error? Please let us know about your desired correction here: E-Mail


Actions (login required)

Show item Show item