Anzahl der Einträge: 6.
Keuper, Margret ; Schmidt, Thorsten ; Temerinac-Ott, Maja ; Padeken, Jan ; Heun, Patrick ; Ronneberger, Olaf ; Brox, Thomas
Blind deconvolution of widefield fluorescence microscopic data by regularization of the Optical Transfer Function (OTF).
Kellenberger, Patrick
2179-2186
In: 2013 IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2013) : Portland, Oregon, USA, 23 - 28 June 2013 ; proceedings
(2013)
Piscataway, NJ
CVPR 2013
(Portland, OR)
[Konferenzveröffentlichung]
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Schmidt, Thorsten ; Dürr, Jasmin ; Keuper, Margret ; Blein, Thomas ; Palme, Klaus ; Ronneberger, Olaf
Variational attenuation correction of two-view confocal microscopic recordings.
169-172
In: 2013 IEEE 10th International Symposium on Biomedical Imaging (ISBI 2013) : San Francisco, California, USA, 7 - 11 April 2013
(2013)
Piscataway, NJ
ISBI 2013
(San Francisco, CA)
[Konferenzveröffentlichung]
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Schmidt, Thorsten ; Keuper, Margret ; Pasternak, Taras ; Palme, Klaus ; Ronneberger, Olaf
Modeling of sparsely sampled tubular surfaces using coupled curves.
Pinz, Axel
Lecture Notes in Computer Science
7476
83-92
In: Pattern recognition : Joint 34th DAGM and 36th OAGM Symposium, Graz, Austria, August 28 - 31, 2012; proceedings
(2012)
Berlin [u.a.]
DAGM/OAGM 2012
(Graz, Austria)
[Konferenzveröffentlichung]
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Keuper, Margret ; Schmidt, Thorsten ; Rodriguez-Franco, Marta ; Schamel, Wolfgang ; Brox, Thomas ; Burkhardt, Hans ; Ronneberger, Olaf
Hierarchical Markov Random Fields for mast cell segmentation in electron microscopic recordings.
973-978
In: IEEE International Symposium on Biomedical Imaging: from Nano to Macro, 2011 : ISBI '11 ; March 30, 2011 - April 2, 2011, Chicago, Illinois, USA ; proceedings
(2011)
Piscataway, NJ
ISBI 2011
(Chicago, IL)
[Konferenzveröffentlichung]
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Keuper, Margret ; Schmidt, Thorsten ; Padeken, Jan ; Heun, Patrick ; Palme, Klaus ; Burkhardt, Hans ; Ronneberger, Olaf
3D deformable surfaces with locally self-adjusting parameters - A robust method to determine cell nucleus shapes.
2254-2257
In: 2010 20th International Conference on Pattern Recognition (ICPR 2010) : Istanbul, Turkey, 23 - 26 August 2010 ; proceedings
(2010)
Piscataway, NJ
ICPR 2010
(Istanbul, Turkey)
[Konferenzveröffentlichung]
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