Exploring the Tail of Patented Invention Value Distributions


Harhoff, Dietmar ; Scherer, Frederic M. ; Vopel, Katrin


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URL: http://ub-madoc.bib.uni-mannheim.de/689
URN: urn:nbn:de:bsz:180-madoc-6893
Document Type: Working paper
Year of publication: 1997
Publication language: English
Institution: Sonstige Einrichtungen > ZEW - Leibniz-Zentrum für Europäische Wirtschaftsforschung
MADOC publication series: Veröffentlichungen des ZEW (Leibniz-Zentrum für Europäische Wirtschaftsforschung) > ZEW Discussion Papers
Subject: 330 Economics
Classification: JEL: O31 O34 ,
Subject headings (SWD): Deutschland <Amerikanische Zone> , Patent , Schiefe Wahrscheinlichkeitsverteilung
Abstract: We explore the tail of patented invention value distributions by using value estimates obtained directly from patent holders. The paper focuses on those full-term German patents of the application year 1977 which were held by West German and U.S. residents. The most valuable patents in our data account for a large fraction of the cumulative value over all observations. Several tests are conducted to pin down more precisely the nature of the high-value tail distribution. Among the Pareto, Singh-Maddala and log normal distributions, the log normal appears to provide the best fit to our patented invention value data.
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Harhoff, Dietmar ; Scherer, Frederic M. ; Vopel, Katrin (1997) Exploring the Tail of Patented Invention Value Distributions. Open Access [Working paper]
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