Advanced Search
Back to overview
Export results as [feed] RSS 1.0 [feed] RSS 2.0

Citation

Order by: Document Type | Year of publication | No order
Skip to: Article | Working paper
Number of items: 2.

Article

Strauß, Daniel J. ; Steidl, Gabriele ; Welzel, Udo (2004) Parameter detection of thin films from their x-ray reflectivity by support vector machines. Applied Numerical Mathematics Amsterdam 48 2 223-236 [Article]

Working paper

Strauß, Daniel J. ; Steidl, Gabriele ; Welzel, Udo (2001) Parameter Detection of Thin Films From Their X-Ray Reflectivity by Support Vector Machines. Open Access None [Working paper]
[img]
Preview

This list was created automatically on Thu Jan 22 05:57:03 2026 CET